Automated Optical Inspection
( AOI )
1
Device Model
TWA-01A
2
Functionality
Fully automatic defect inspection of wafers / chips / lines during production.
TWA-01A
Fully automatic defect inspection of wafers / chips / lines during production.
China. Jiangsu, Suzhou Industrial Park, Fang Zhou road, No. 128, a district D
Email:
mike.lou@tec-global.com
Phone:
+86-512-62968146